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Evaluating the accuracy of rietveld analysis for diffraction data from nanocrystalline powders

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dc.contributor.authorHekmatjou, Hamidreza
dc.contributor.authorÖztürk, Hande
dc.contributor.departmentMechanical Engineering
dc.contributor.ozuauthorKAYMAKSÜT, Hande Öztürk
dc.contributor.ozugradstudentHekmatjou, Hamidreza
dc.date.accessioned2023-09-08T07:43:14Z
dc.date.available2023-09-08T07:43:14Z
dc.date.issued2022-08
dc.description.abstractN/Aen_US
dc.identifier.endpageE252en_US
dc.identifier.issn2053-2733
dc.identifier.startpageE252en_US
dc.identifier.urihttp://hdl.handle.net/10679/8773
dc.identifier.volume78
dc.identifier.wos001048207700210
dc.language.isoengen_US
dc.publicationstatusPublisheden_US
dc.publisherInternational Union of Crystallographyen_US
dc.relation.ispartofActa Crystallographica A-foundation and Advances
dc.rightsinfo:eu-repo/semantics/openAccess
dc.titleEvaluating the accuracy of rietveld analysis for diffraction data from nanocrystalline powdersen_US
dc.typeMeeting abstracten_US
dspace.entity.typePublication
relation.isOrgUnitOfPublicationdaa77406-1417-4308-b110-2625bf3b3dd7
relation.isOrgUnitOfPublication.latestForDiscoverydaa77406-1417-4308-b110-2625bf3b3dd7

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