Publication: 25th IFIP/IEEE conference on very large scale integration (VLSI-SoC 2017)
dc.contributor.author | Elfadel, I. A. M. | |
dc.contributor.author | Uğurdağ, Hasan Fatih | |
dc.contributor.department | Electrical & Electronics Engineering | |
dc.contributor.ozuauthor | UĞURDAĞ, Hasan Fatih | |
dc.date.accessioned | 2018-10-01T17:15:02Z | |
dc.date.available | 2018-10-01T17:15:02Z | |
dc.date.issued | 2018-02 | |
dc.description.abstract | The 25th IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2017) was held between 23 and 25 October in the landmark Yas Viceroy Hotel, overlooking the Formula 1 Yas Marina racetrack in Yas Island, Abu Dhabi, United Arab Emirates (UAE). The conference was held under the overarching theme: “The Internet of Things: SoC Challenges and Opportunities,” and featured four keynote addresses on this topic by renowned leaders from industry and academia, including Dr. Yervant Zorian, Synopsys Fellow and President of Synopsys Armenia, Dr. Rafic Makki, Executive Fellow, GLOBALFOUNDRIES, Dr. Leon Stok, VP EDA, IBM, and Prof. Simha Sethumadhavan, Columbia University. Prof. Tod A. Laursen, President of Khalifa University of Science and Technology gave the Welcome Address at the Opening Session. | en_US |
dc.description.sponsorship | IEEE Test Technology Technical Council ; IEEE Solid State Circuits Society | |
dc.identifier.doi | 10.1109/MDAT.2017.2783194 | en_US |
dc.identifier.endpage | 98 | en_US |
dc.identifier.issn | 2168-2356 | en_US |
dc.identifier.issue | 1 | en_US |
dc.identifier.scopus | 2-s2.0-85041905522 | |
dc.identifier.startpage | 97 | en_US |
dc.identifier.uri | http://hdl.handle.net/10679/5988 | |
dc.identifier.uri | https://doi.org/10.1109/MDAT.2017.2783194 | |
dc.identifier.volume | 35 | en_US |
dc.identifier.wos | 000424635400014 | |
dc.language.iso | eng | en_US |
dc.publicationstatus | Published | en_US |
dc.publisher | IEEE | en_US |
dc.relation.ispartof | IEEE Design and Test | |
dc.rights | restrictedAccess | |
dc.title | 25th IFIP/IEEE conference on very large scale integration (VLSI-SoC 2017) | en_US |
dc.type | Editorial | en_US |
dspace.entity.type | Publication | |
relation.isOrgUnitOfPublication | 7b58c5c4-dccc-40a3-aaf2-9b209113b763 | |
relation.isOrgUnitOfPublication.latestForDiscovery | 7b58c5c4-dccc-40a3-aaf2-9b209113b763 |
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