Evaluating the accuracy of rietveld analysis for diffraction data from nanocrystalline powders
dc.contributor.author | Hekmatjou, Hamidreza | |
dc.contributor.author | Öztürk, Hande | |
dc.date.accessioned | 2023-09-08T07:43:14Z | |
dc.date.available | 2023-09-08T07:43:14Z | |
dc.date.issued | 2022-08 | |
dc.identifier.issn | 2053-2733 | |
dc.identifier.uri | http://hdl.handle.net/10679/8773 | |
dc.identifier.uri | https://scripts.iucr.org/cgi-bin/paper?S205327332209461X | |
dc.description.abstract | N/A | en_US |
dc.language.iso | eng | en_US |
dc.publisher | International Union of Crystallography | en_US |
dc.relation.ispartof | Acta Crystallographica A-foundation and Advances | |
dc.rights | openAccess | |
dc.title | Evaluating the accuracy of rietveld analysis for diffraction data from nanocrystalline powders | en_US |
dc.type | Meeting abstract | en_US |
dc.publicationstatus | Published | en_US |
dc.contributor.department | Özyeğin University | |
dc.contributor.authorID | (ORCID 0000-0002-1010-4001 & YÖK ID 295748) Öztürk, Hande | |
dc.contributor.ozuauthor | Öztürk, Hande | |
dc.identifier.volume | 78 | |
dc.identifier.startpage | E252 | en_US |
dc.identifier.endpage | E252 | en_US |
dc.identifier.wos | WOS:001048207700210 | |
dc.contributor.ozugradstudent | Hekmatjou, Hamidreza | |
dc.relation.publicationcategory | Meeting Abstract - Institutional Academic Staff |
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