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dc.contributor.authorŞimşek, Uğur
dc.contributor.authorGayir, C. E.
dc.contributor.authorKiziltas, G.
dc.contributor.authorŞendur, Polat
dc.date.accessioned2020-11-03T20:16:49Z
dc.date.available2020-11-03T20:16:49Z
dc.date.issued2020
dc.identifier.issn0268-3768en_US
dc.identifier.urihttp://hdl.handle.net/10679/7059
dc.identifier.urihttps://link.springer.com/article/10.1007/s00170-020-06207-8
dc.description.abstractThe manufacturing of lattice structures has been greatly facilitated thanks to the advances in additive manufacturing. Functionally graded lattice (FGL) structures, a major class of such structures, developed using topology optimization (TO) are known to have superior mechanical characteristics such as high stiffness to weight ratio. A new design methodology using an integrated TO process is proposed for the development of FGL structures in this research. For that purpose, a material-penalization formula derived by the application of homogenization is integrated into the TO process. As a result, relative densities of the TO are mapped directly. This approach is more advantageous compared with the alternative techniques as there is no need to post-process the optimization results. Therefore, the degradation of the optimization results from post-processing is eliminated. Then, radial basis functions (RBFs) are used to create the geometry of the FGLs efficiently. The proposed methodology is demonstrated on a case study, where a cantilever beam with a desired bandgap characteristic is designed. Numerical results using the proposed method show that the first and second bending frequencies with the resulting optimized geometry are within 3% and 12% of the original TO design, whereas using method 1 the calculated relative errors are 24% and 74% and method 2 these errors are calculated as 8% and 34%, respectively. These comparative results indicate that the geometry created by the new method is superior to other design strategies as evidenced by the improved compatibility level between the bandgap performance results of the original unpenalized TO and structures generated using alternative techniques.en_US
dc.description.sponsorshipTÜBİTAK
dc.language.isoengen_US
dc.publisherSpringer Natureen_US
dc.relationinfo:turkey/grantAgreement/TUBITAK/5158001
dc.relation.ispartofThe International Journal of Advanced Manufacturing Technology
dc.rightsrestrictedAccess
dc.titleAn integrated homogenization–based topology optimization via RBF mapping strategies for additively manufactured FGLS and its application to bandgap structuresen_US
dc.typeArticleen_US
dc.peerreviewedyesen_US
dc.publicationstatusPublished onlineen_US
dc.contributor.departmentÖzyeğin University
dc.contributor.authorID(ORCID 0000-0003-2212-7419 & YÖK ID 274138) Şendur, Polat
dc.contributor.ozuauthorŞendur, Polat
dc.identifier.wosWOS:000577090300004
dc.identifier.doi10.1007/s00170-020-06207-8en_US
dc.subject.keywordsModified SIMPen_US
dc.subject.keywordsGraded gyroiden_US
dc.subject.keywordsBandgap designen_US
dc.subject.keywordsHomogenizationen_US
dc.identifier.scopusSCOPUS:2-s2.0-85092333746
dc.contributor.ozugradstudentŞimşek, Uğur
dc.contributor.authorMale2
dc.relation.publicationcategoryArticle - International Refereed Journal - Institutional Academic Staff and PhD Student


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