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Evaluating the accuracy of rietveld analysis for diffraction data from nanocrystalline powders

dc.contributor.authorHekmatjou, Hamidreza
dc.contributor.authorÖztürk, Hande
dc.date.accessioned2023-09-08T07:43:14Z
dc.date.available2023-09-08T07:43:14Z
dc.date.issued2022-08
dc.identifier.issn2053-2733
dc.identifier.urihttp://hdl.handle.net/10679/8773
dc.identifier.urihttps://scripts.iucr.org/cgi-bin/paper?S205327332209461X
dc.description.abstractN/Aen_US
dc.language.isoengen_US
dc.publisherInternational Union of Crystallographyen_US
dc.relation.ispartofActa Crystallographica A-foundation and Advances
dc.rightsopenAccess
dc.titleEvaluating the accuracy of rietveld analysis for diffraction data from nanocrystalline powdersen_US
dc.typeMeeting abstracten_US
dc.publicationstatusPublisheden_US
dc.contributor.departmentÖzyeğin University
dc.contributor.authorID(ORCID 0000-0002-1010-4001 & YÖK ID 295748) Öztürk, Hande
dc.contributor.ozuauthorÖztürk, Hande
dc.identifier.volume78
dc.identifier.startpageE252en_US
dc.identifier.endpageE252en_US
dc.identifier.wosWOS:001048207700210
dc.contributor.ozugradstudentHekmatjou, Hamidreza
dc.relation.publicationcategoryMeeting Abstract - Institutional Academic Staff


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