Show simple item record

dc.contributor.authorCerutti, F.
dc.contributor.authorKaplan, L. M.
dc.contributor.authorKimmig, A.
dc.contributor.authorŞensoy, Murat
dc.date.accessioned2023-07-14T11:52:27Z
dc.date.available2023-07-14T11:52:27Z
dc.date.issued2022-04
dc.identifier.issn0885-6125en_US
dc.identifier.urihttp://hdl.handle.net/10679/8511
dc.identifier.urihttps://link.springer.com/article/10.1007/s10994-021-06086-4
dc.description.abstractWhen collaborating with an AI system, we need to assess when to trust its recommendations. If we mistakenly trust it in regions where it is likely to err, catastrophic failures may occur, hence the need for Bayesian approaches for probabilistic reasoning in order to determine the confidence (or epistemic uncertainty) in the probabilities in light of the training data. We propose an approach to Bayesian inference of posterior distributions that overcomes the independence assumption behind most of the approaches dealing with a large class of probabilistic reasoning that includes Bayesian networks as well as several instances of probabilistic logic. We provide an algorithm for Bayesian inference of posterior distributions from sparse, albeit complete, observations, and for deriving inferences and their confidences keeping track of the dependencies between variables when they are manipulated within the unifying computational formalism provided by probabilistic circuits. Each leaf of such circuits is labelled with a beta-distributed random variable that provides us with an elegant framework for representing uncertain probabilities. We achieve better estimation of epistemic uncertainty than state-of-the-art approaches, including highly engineered ones, while being able to handle general circuits and with just a modest increase in the computational effort compared to using point probabilities.en_US
dc.description.sponsorshipUnited States Department of Defense US Army Research Laboratory (ARL) ; U.K. Ministry of Defence
dc.language.isoengen_US
dc.publisherSpringeren_US
dc.relation.ispartofMachine Learning
dc.rightsrestrictedAccess
dc.titleHandling epistemic and aleatory uncertainties in probabilistic circuitsen_US
dc.typeArticleen_US
dc.peerreviewedyesen_US
dc.publicationstatusPublisheden_US
dc.contributor.departmentÖzyeğin University
dc.contributor.authorID(ORCID 0000-0001-8806-4508 & YÖK ID 41438) Şensoy, Murat
dc.contributor.ozuauthorŞensoy, Murat
dc.identifier.volume111en_US
dc.identifier.issue4en_US
dc.identifier.startpage1259en_US
dc.identifier.endpage1301en_US
dc.identifier.wosWOS:000740624700001
dc.identifier.doi10.1007/s10994-021-06086-4en_US
dc.subject.keywordsBayesian learningen_US
dc.subject.keywordsImprecise probabilitiesen_US
dc.subject.keywordsProbabilistic circuiten_US
dc.identifier.scopusSCOPUS:2-s2.0-85122670881
dc.relation.publicationcategoryArticle - International Refereed Journal - Institutional Academic Staff


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record


Share this page