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dc.contributor.authorÇıngıl, T.
dc.contributor.authorSözer, Hasan
dc.date.accessioned2023-06-22T09:53:58Z
dc.date.available2023-06-22T09:53:58Z
dc.date.issued2022-06
dc.identifier.isbn978-145039613-4
dc.identifier.urihttp://hdl.handle.net/10679/8458
dc.identifier.urihttps://dl.acm.org/doi/10.1145/3530019.3530023
dc.description.abstractSoftware continuously changes to address new requirements and to fix defects. Regression testing is performed to ensure that the applied changes do not adversely affect existing functionality. The increasing number of test cases makes it infeasible to execute the whole regression test suite. Test case selection is adopted to select a subset of the test suite, which is associated with the changed parts of the software. These parts are assumed to be error-prone. We present and evaluate a test case selection approach in the context of black-box regression testing of embedded systems. In this context, it is challenging to relate test cases with a set of distinct source code elements to be able to select those test cases associated with the modified parts of the source code. We analyze previously fixed defects for this purpose. We relate test cases that detect these defects with the source files that are previously modified for fixing them. Then, we select test cases related with source code files that are modified in the subsequent revision. The strength of this relation is determined as the number of changes associated with fixed defects previously detected by the same test cases. We conduct a case study on 3 real projects from the consumer electronics domain. Results show that it is possible to detect from 65% up to 85% of the defects detected by the whole test suite by selecting from 30% up to 70% of the test cases.en_US
dc.language.isoengen_US
dc.publisherACMen_US
dc.relation.ispartofEASE '22: Proceedings of the 26th International Conference on Evaluation and Assessment in Software Engineering
dc.rightsrestrictedAccess
dc.titleBlack-box test case selection by relating code changes with previously fixed defectsen_US
dc.typeConference paperen_US
dc.publicationstatusPublisheden_US
dc.contributor.departmentÖzyeğin University
dc.contributor.authorID(ORCID 0000-0002-2968-4763 & YÖK ID 23178) Sözer, Hasan
dc.contributor.ozuauthorSözer, Hasan
dc.identifier.startpage30en_US
dc.identifier.endpage39en_US
dc.identifier.doi10.1145/3530019.3530023en_US
dc.subject.keywordsBlack-box testingen_US
dc.subject.keywordsIndustrial case studyen_US
dc.subject.keywordsRegression testingen_US
dc.subject.keywordsRepository miningen_US
dc.subject.keywordsTest case selectionen_US
dc.identifier.scopusSCOPUS:2-s2.0-85132412041
dc.relation.publicationcategoryConference Paper - International - Institutional Academic Staff


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