Browsing Faculty of Engineering by Author "Ge, M."

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Resolving 500 nm axial separation by multi-slice X-ray ptychography

Huang, X.; Yan, H.; Ge, M.; Öztürk, Hande; Fang, Y.-L. L.; Ha, S.; Lin, M.; Lu, M.; Nazaretski, E.; Robinson, I. K.; Chu, Y. S. (International Union of Crystallography, 2019-03)

Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set ...