Charnigo, R.Francoeur, M.Kenkel, P.Mengüç, Mustafa PınarHall, B.Srinivasan, C.2012-06-052012-06-052011-050022-4073http://hdl.handle.net/10679/202https://doi.org/10.1016/j.jqsrt.2011.01.019Due to copyright restrictions, the access to the full text of this article is only available via subscription.Characterization of nanoparticles on surfaces is a challenging in verse problem whose solution has many practical applications. This article proposes a method, suitable for in situ characterization systems, for estimating quantitative features of nanoparticles on surfaces from scattering profiles and their derivatives. Our method enjoys a number of advantages over competing approaches to this inverse problem. One such advantage is that only a partial solution is required for the companion direct problem. For example, estimating the average diameter of nanoparticles to be 53 nm is possible even when a researcher’s existing scattering data pertain to nanoparticles whose average diameters are in multiples of 5 nm. Two numerical studies illustrate the implementation and performance of our method for inferring nanoparticle diameters and agglomeration levels respectively.enginfo:eu-repo/semantics/restrictedAccessArticle11281369138200028981260001110.1016/j.jqsrt.2011.01.019CharacterizationCompound estimatorEvanescent waveDirect problemInverse problemScattering profile2-s2.0-79952899485