Noyan, İ. C.Öztürk, Hande2023-06-222023-06-222022-060021-8898http://hdl.handle.net/10679/8465https://doi.org/10.1107/S1600576722002564A self-consistent analysis is reported of traditional diffraction-based particle size determination techniques applied to synthetic diffraction profiles generated with the Patterson approach. The results show that dimensions obtained from traditional techniques utilizing peak fitting or Fourier analysis for single-crystal nanoparticles have best-case error bounds of around 5%. For arbitrarily shaped particles, lower error magnitudes are possible only if the zeroes of the thickness fringes are used. The errors for sizes obtained by integral-breadth-And Fourier-decomposition-based techniques depend on the shape of the diffracting domains. In the case of integral-breadth analysis, crystal shapes which scatter more intensity into the central peak of the rocking curve have lower size errors. For Fourier-decomposition analysis, crystals which have non-uniform distributions of chord lengths exhibit nonlinearities in the initial ranges of the normalized Fourier cosine coefficient versus column length (|A L | versus L) plots, even when the entire rocking curve is used in the decomposition. It is recommended that, in routine analysis, all domain size determination techniques should be applied to all reflections in a diffraction pattern. If there is significant divergence among these results, the 'average particle size(s)' obtained might not be reliable.engAttribution 4.0 InternationalopenAccesshttp://creativecommons.org/licenses/by/4.0/article5545547000081076330000210.1107/S1600576722002564DiffractionFourier analysisIntegral breadthParticle size determinationScherrer approach2-s2.0-85131749949