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dc.contributor.authorKıraç, Mustafa Furkan
dc.contributor.authorAktemur, Tankut Barış
dc.contributor.authorSözer, Hasan
dc.contributor.authorGebizli, C. Ş.
dc.date.accessioned2020-07-08T07:50:22Z
dc.date.available2020-07-08T07:50:22Z
dc.date.issued2019-06
dc.identifier.issn0963-9314en_US
dc.identifier.urihttp://hdl.handle.net/10679/6730
dc.identifier.urihttps://dl.acm.org/doi/10.1007/s11219-018-9439-1
dc.description.abstractWe propose a novel technique based on recurrent artificial neural networks to generate test cases for black-box testing of reactive systems. We combine functional testing inputs that are automatically generated from a model together with manually-applied test cases for robustness testing. We use this combination to train a long short-term memory (LSTM) network. As a result, the network learns an implicit representation of the usage behavior that is liable to failures. We use this network to generate new event sequences as test cases. We applied our approach in the context of an industrial case study for the black-box testing of a digital TV system. LSTM-generated test cases were able to reveal several faults, including critical ones, that were not detected with existing automated or manual testing activities. Our approach is complementary to model-based and exploratory testing, and the combined approach outperforms random testing in terms of both fault coverage and execution time.en_US
dc.language.isoengen_US
dc.publisherThe ACM Digital Libraryen_US
dc.relation.ispartofSoftware Quality Journal
dc.rightsrestrictedAccess
dc.titleAutomatically learning usage behavior and generating event sequences for black-box testing of reactive systemsen_US
dc.typeArticleen_US
dc.peerreviewedyesen_US
dc.publicationstatusPublisheden_US
dc.contributor.departmentÖzyeğin University
dc.contributor.authorID(ORCID 0000-0001-9177-0489 & YÖK ID 124619) Kıraç, Furkan
dc.contributor.authorID(ORCID 0000-0002-1414-9338 & YÖK ID 124803) Aktemur, Barış
dc.contributor.authorID(ORCID 0000-0002-2968-4763 & YÖK ID 23178) Sözer, Hasan
dc.contributor.ozuauthorKıraç, Mustafa Furkan
dc.contributor.ozuauthorAktemur, Tankut Barış
dc.contributor.ozuauthorSözer, Hasan
dc.identifier.volume27en_US
dc.identifier.issue2en_US
dc.identifier.startpage861en_US
dc.identifier.endpage883en_US
dc.identifier.wosWOS:000470767500014
dc.identifier.doi10.1007/s11219-018-9439-1en_US
dc.subject.keywordsTest case generationen_US
dc.subject.keywordsBlack-box testingen_US
dc.subject.keywordsRecurrent neural networksen_US
dc.subject.keywordsLong short-term memory networksen_US
dc.subject.keywordsLearning usage behavioren_US
dc.identifier.scopusSCOPUS:2-s2.0-85059878995
dc.contributor.authorMale3
dc.relation.publicationcategoryArticle - International Refereed Journal - Institutional Academic Staff


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