Browsing Mechanical Engineering by Subject "Characterization"
Now showing items 1-3 of 3
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Estimating quantitative features of nanoparticles using multiple derivatives of scattering profiles
(Elsevier, 2011-05)Characterization of nanoparticles on surfaces is a challenging in verse problem whose solution has many practical applications. This article proposes a method, suitable for in situ characterization systems, for estimating ... -
Metal oxide thin film characterization for new generation chemical mechanical planarization development
(The Electrochemical Society, 2016)This study targets to create a basis for the process development in the new generation semiconductor industry dealing with atomic scale devices. We focus on the CMP process development as it is used for the current and ... -
Polarization imaging of multiply-scattered radiation based on integral-vector Monte Carlo method
(Elsevier, 2010-01)A new integral-vector Monte Carlo method (IVMCM) is developed to analyze the transfer of polarized radiation in 3D multiple scattering particle-laden media. The method is based on a “successive order of scattering series” ...
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