Optical subwavelength-scale displacement sensing with dynamically controllable characteristics
dc.contributor.author | Bulgan, Erdal | |
dc.date.accessioned | 2016-07-26T12:21:38Z | |
dc.date.available | 2016-07-26T12:21:38Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 2162-2701 | |
dc.identifier.uri | http://hdl.handle.net/10679/4278 | |
dc.identifier.uri | https://www.osapublishing.org/abstract.cfm?uri=Sensors-2010-SWD5 | |
dc.description | Due to copyright restrictions, the access to the full text of this article is only available via subscription. | |
dc.description.abstract | Silicon photonic devices with embedded MEMS have significantly been studied. Characterization and operation of such devices in the nanometer-level is critical. A novel optical technique for subwavelength displacement measurements with dynamically controllable characteristics is introduced. | |
dc.language.iso | eng | en_US |
dc.publisher | The Optical Society | |
dc.relation.ispartof | Optics InfoBase Conference Papers | |
dc.rights | restrictedAccess | |
dc.title | Optical subwavelength-scale displacement sensing with dynamically controllable characteristics | en_US |
dc.type | Conference paper | en_US |
dc.publicationstatus | published | en_US |
dc.contributor.department | Özyeğin University | |
dc.contributor.authorID | (ORCID & YÖK ID 113204) Bulgan, Erdal | |
dc.contributor.ozuauthor | Bulgan, Erdal | |
dc.subject.keywords | Displacement sensing | |
dc.subject.keywords | Optical sensing | |
dc.subject.keywords | Silicon photonic devices | |
dc.identifier.scopus | SCOPUS:2-s2.0-84897747859 | |
dc.contributor.authorMale | 1 | |
dc.relation.publicationcategory | Conference Paper - Institutional Academic Staff |
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