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dc.contributor.authorDirim, S.
dc.contributor.authorSözer, Hasan
dc.date.accessioned2021-03-22T09:20:47Z
dc.date.available2021-03-22T09:20:47Z
dc.date.issued2020-10
dc.identifier.isbn978-1-7281-1075-2
dc.identifier.issn2159-4848
dc.identifier.urihttp://hdl.handle.net/10679/7397
dc.identifier.urihttps://ieeexplore.ieee.org/document/9155581
dc.description.abstractWe present an industrial case study on the application of test case prioritization techniques in the context of certification testing in consumer electronics domain. Test execution times and fault severities are subject to high variations in this domain. As a result, most of the existing techniques and metrics turn out to be inappropriate for this application context. We discuss such deficiencies and the room for improvement based on our case study with the certification test suites of 3 Smart TV applications as real experimental objects. We also propose a new metric, LAPFD, which is based on the calculation of the average of the percentage of faults detected. This calculation is weighted according to the cost of test cases and calculated separately per severity class. Then, a lexicographic ordering is performed based on these classes. We compared the baseline (random) ordering of test cases with respect to an alternative ordering based on cost, measured as the test execution time. These alternative orderings are evaluated by using the LAPFD metric. We observed that cost-based ordering of test cases consistently outperformed random ordering. Another observation is that there is a large room for improvement regarding the effectiveness of test case prioritization in this application domain.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.ispartof2020 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
dc.rightsrestrictedAccess
dc.titlePrioritization of test cases with varying test costs and fault severities for certification testingen_US
dc.typeConference paperen_US
dc.publicationstatusPublisheden_US
dc.contributor.departmentÖzyeğin University
dc.contributor.authorID(ORCID 0000-0002-2968-4763 & YÖK ID 23178) Sözer, Hasan
dc.contributor.ozuauthorSözer, Hasan
dc.identifier.startpage386en_US
dc.identifier.endpage391en_US
dc.identifier.wosWOS:000620795100052
dc.identifier.wosWOS:000620795100052
dc.identifier.doihttps://doi.org/10.1109/ICSTW50294.2020.00069en_US
dc.subject.keywordsCertification testingen_US
dc.subject.keywordsTest case prioritizationen_US
dc.subject.keywordsFault severityen_US
dc.subject.keywordsTest costen_US
dc.subject.keywordsIndustrial case studyen_US
dc.identifier.scopusSCOPUS:2-s2.0-85091759678
dc.relation.publicationcategoryConference Paper - International - Institutional Academic Staff


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