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dc.contributor.authorElfadel, I. A. M.
dc.contributor.authorUğurdağ, Hasan Fatih
dc.date.accessioned2018-10-01T17:15:02Z
dc.date.available2018-10-01T17:15:02Z
dc.date.issued2018-02
dc.identifier.issn2168-2356en_US
dc.identifier.urihttp://hdl.handle.net/10679/5988
dc.identifier.urihttps://ieeexplore.ieee.org/document/8281129
dc.description.abstractThe 25th IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2017) was held between 23 and 25 October in the landmark Yas Viceroy Hotel, overlooking the Formula 1 Yas Marina racetrack in Yas Island, Abu Dhabi, United Arab Emirates (UAE). The conference was held under the overarching theme: “The Internet of Things: SoC Challenges and Opportunities,” and featured four keynote addresses on this topic by renowned leaders from industry and academia, including Dr. Yervant Zorian, Synopsys Fellow and President of Synopsys Armenia, Dr. Rafic Makki, Executive Fellow, GLOBALFOUNDRIES, Dr. Leon Stok, VP EDA, IBM, and Prof. Simha Sethumadhavan, Columbia University. Prof. Tod A. Laursen, President of Khalifa University of Science and Technology gave the Welcome Address at the Opening Session.en_US
dc.description.sponsorshipIEEE Test Technology Technical Council ; IEEE Solid State Circuits Society
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.ispartofIEEE Design and Test
dc.rightsrestrictedAccess
dc.title25th IFIP/IEEE conference on very large scale integration (VLSI-SoC 2017)en_US
dc.typeEditorialen_US
dc.publicationstatusPublisheden_US
dc.contributor.departmentÖzyeğin University
dc.contributor.authorID(ORCID 0000-0002-6256-0850 & YÖK ID 118293) Uğurdağ, Fatih
dc.contributor.ozuauthorUğurdağ, Hasan Fatih
dc.identifier.volume35en_US
dc.identifier.issue1en_US
dc.identifier.startpage97en_US
dc.identifier.endpage98en_US
dc.identifier.wosWOS:000424635400014
dc.identifier.doi10.1109/MDAT.2017.2783194en_US
dc.identifier.scopusSCOPUS:2-s2.0-85041905522
dc.contributor.authorMale1
dc.relation.publicationcategoryEditorial - International - Institution Academic Staff


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