Resolving 500 nm axial separation by multi-slice X-ray ptychography
dc.contributor.author | Huang, X. | |
dc.contributor.author | Yan, H. | |
dc.contributor.author | Ge, M. | |
dc.contributor.author | Öztürk, Hande | |
dc.contributor.author | Fang, Y.-L. L. | |
dc.contributor.author | Ha, S. | |
dc.contributor.author | Lin, M. | |
dc.contributor.author | Lu, M. | |
dc.contributor.author | Nazaretski, E. | |
dc.contributor.author | Robinson, I. K. | |
dc.contributor.author | Chu, Y. S. | |
dc.date.accessioned | 2020-09-08T10:25:00Z | |
dc.date.available | 2020-09-08T10:25:00Z | |
dc.date.issued | 2019-03 | |
dc.identifier.issn | 2053-2733 | en_US |
dc.identifier.uri | http://hdl.handle.net/10679/6920 | |
dc.identifier.uri | https://journals.iucr.org/a/issues/2019/02/00/wo5033/ | |
dc.description.abstract | Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the specimen. Here, we present an experimental demonstration that resolves two layers of nanostructures separated by 500 nm along the axial direction, with sub-10 nm and sub-20 nm resolutions on two layers, respectively. Fluorescence maps are simultaneously measured in the multi-modality imaging scheme to assist in decoupling the mixture of low-spatial-frequency features across different slices. The enhanced axial sectioning capability using correlative signals obtained from multi-modality measurements demonstrates the great potential of the multi-slice ptychography method for investigating specimens with extended dimensions in 3D with high resolution. | en_US |
dc.description.sponsorship | Laboratory Directed Research and Development program from the Brookhaven National Laboratory ; United States Department of Energy (DOE) | |
dc.language.iso | eng | en_US |
dc.publisher | International Union of Crystallography | en_US |
dc.relation.ispartof | Acta Crystallographica Section A: Foundations and Advances | |
dc.rights | openAccess | |
dc.title | Resolving 500 nm axial separation by multi-slice X-ray ptychography | en_US |
dc.type | Article | en_US |
dc.description.version | Publisher version | en_US |
dc.peerreviewed | yes | en_US |
dc.publicationstatus | Published | en_US |
dc.contributor.department | Özyeğin University | |
dc.contributor.authorID | (ORCID 0000-0002-1010-4001 & YÖK ID 295748) Öztürk, Hande | |
dc.contributor.ozuauthor | Öztürk, Hande | |
dc.identifier.volume | 75 | en_US |
dc.identifier.startpage | 336 | en_US |
dc.identifier.endpage | 341 | en_US |
dc.identifier.wos | WOS:000460056400012 | |
dc.identifier.doi | 10.1107/S2053273318017229 | en_US |
dc.subject.keywords | X-ray ptychography | en_US |
dc.subject.keywords | Multi-slice approach | en_US |
dc.subject.keywords | Nanostructures | en_US |
dc.identifier.scopus | SCOPUS:2-s2.0-85061493285 | |
dc.contributor.authorFemale | 1 | |
dc.relation.publicationcategory | Article - International Refereed Journal - Institution Academic Staff |
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