Estimating quantitative features of nanoparticles using multiple derivatives of scattering profiles
dc.contributor.author | Charnigo, R. | |
dc.contributor.author | Francoeur, M. | |
dc.contributor.author | Kenkel, P. | |
dc.contributor.author | Mengüç, Mustafa Pınar | |
dc.contributor.author | Hall, B. | |
dc.contributor.author | Srinivasan, C. | |
dc.date.accessioned | 2012-06-05T06:31:11Z | |
dc.date.available | 2012-06-05T06:31:11Z | |
dc.date.issued | 2011-05 | |
dc.identifier.issn | 0022-4073 | |
dc.identifier.uri | http://hdl.handle.net/10679/202 | |
dc.identifier.uri | http://www.sciencedirect.com/science/article/pii/S0022407311000446 | |
dc.description | Due to copyright restrictions, the access to the full text of this article is only available via subscription. | en_US |
dc.description.abstract | Characterization of nanoparticles on surfaces is a challenging in verse problem whose solution has many practical applications. This article proposes a method, suitable for in situ characterization systems, for estimating quantitative features of nanoparticles on surfaces from scattering profiles and their derivatives. Our method enjoys a number of advantages over competing approaches to this inverse problem. One such advantage is that only a partial solution is required for the companion direct problem. For example, estimating the average diameter of nanoparticles to be 53 nm is possible even when a researcher’s existing scattering data pertain to nanoparticles whose average diameters are in multiples of 5 nm. Two numerical studies illustrate the implementation and performance of our method for inferring nanoparticle diameters and agglomeration levels respectively. | en_US |
dc.description.sponsorship | NSF | |
dc.language.iso | eng | en_US |
dc.publisher | Elsevier | en_US |
dc.relation.ispartof | Journal of Quantitative Spectroscopy and Radiative Transfer | |
dc.rights | restrictedAccess | |
dc.title | Estimating quantitative features of nanoparticles using multiple derivatives of scattering profiles | en_US |
dc.type | Article | en_US |
dc.peerreviewed | yes | en_US |
dc.publicationstatus | published | en_US |
dc.contributor.department | Özyeğin University | |
dc.contributor.authorID | (ORCID 0000-0001-5483-587X & YÖK ID 141825) Mengüç, Pınar | |
dc.contributor.ozuauthor | Mengüç, Mustafa Pınar | |
dc.identifier.volume | 112 | |
dc.identifier.issue | 8 | |
dc.identifier.startpage | 1369 | |
dc.identifier.endpage | 1382 | |
dc.identifier.wos | WOS:000289812600011 | |
dc.identifier.doi | 10.1016/j.jqsrt.2011.01.019 | |
dc.subject.keywords | Characterization | en_US |
dc.subject.keywords | Compound estimator | en_US |
dc.subject.keywords | Evanescent wave | en_US |
dc.subject.keywords | Direct problem | en_US |
dc.subject.keywords | Inverse problem | en_US |
dc.subject.keywords | Scattering profile | en_US |
dc.identifier.scopus | SCOPUS:2-s2.0-79952899485 | |
dc.contributor.authorMale | 1 |
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