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dc.contributor.authorCharnigo, R.
dc.contributor.authorFrancoeur, M.
dc.contributor.authorKenkel, P.
dc.contributor.authorMengüç, Mustafa Pınar
dc.contributor.authorHall, B.
dc.contributor.authorSrinivasan, C.
dc.date.accessioned2012-06-05T06:31:11Z
dc.date.available2012-06-05T06:31:11Z
dc.date.issued2011-05
dc.identifier.issn0022-4073
dc.identifier.urihttp://hdl.handle.net/10679/202
dc.identifier.urihttp://www.sciencedirect.com/science/article/pii/S0022407311000446
dc.descriptionDue to copyright restrictions, the access to the full text of this article is only available via subscription.en_US
dc.description.abstractCharacterization of nanoparticles on surfaces is a challenging in verse problem whose solution has many practical applications. This article proposes a method, suitable for in situ characterization systems, for estimating quantitative features of nanoparticles on surfaces from scattering profiles and their derivatives. Our method enjoys a number of advantages over competing approaches to this inverse problem. One such advantage is that only a partial solution is required for the companion direct problem. For example, estimating the average diameter of nanoparticles to be 53 nm is possible even when a researcher’s existing scattering data pertain to nanoparticles whose average diameters are in multiples of 5 nm. Two numerical studies illustrate the implementation and performance of our method for inferring nanoparticle diameters and agglomeration levels respectively.en_US
dc.description.sponsorshipNSF
dc.language.isoengen_US
dc.publisherElsevieren_US
dc.relation.ispartofJournal of Quantitative Spectroscopy and Radiative Transfer
dc.rightsrestrictedAccess
dc.titleEstimating quantitative features of nanoparticles using multiple derivatives of scattering profilesen_US
dc.typeArticleen_US
dc.peerreviewedyesen_US
dc.publicationstatuspublisheden_US
dc.contributor.departmentÖzyeğin University
dc.contributor.authorID(ORCID 0000-0001-5483-587X & YÖK ID 141825) Mengüç, Pınar
dc.contributor.ozuauthorMengüç, Mustafa Pınar
dc.identifier.volume112
dc.identifier.issue8
dc.identifier.startpage1369
dc.identifier.endpage1382
dc.identifier.wosWOS:000289812600011
dc.identifier.doi10.1016/j.jqsrt.2011.01.019
dc.subject.keywordsCharacterizationen_US
dc.subject.keywordsCompound estimatoren_US
dc.subject.keywordsEvanescent waveen_US
dc.subject.keywordsDirect problemen_US
dc.subject.keywordsInverse problemen_US
dc.subject.keywordsScattering profileen_US
dc.identifier.scopusSCOPUS:2-s2.0-79952899485


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